ISIS

Facilitates the interpretation and analysis of high resolution X-ray spectra.
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ISIS Ranking & Summary

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  • Rating:
  • License:
  • GPL
  • Price:
  • FREE
  • Publisher Name:
  • John C. Houck
  • Publisher web site:
  • http://space.mit.edu/ASC/ISIS/

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ISIS Description

Facilitates the interpretation and analysis of high resolution X-ray spectra. ISIS (Interactive Spectral Interpretation System) is designed to facilitate the interpretation and analysis of high resolution X-ray spectra. It is being developed as a programmable, interactive tool for studying the physics of X-ray spectrum formation, supporting measurement and identification of spectral features, and interaction with a database of atomic structure parameters and plasma emission models. Here are some key features of "ISIS": · Efficiently generate multi-component spectral models using the APEC/APED spectroscopy database for collisionally ionized plasmas, including user-defined line profiles. · Automatically generate custom, multi-component APEC/APED fit-functions for specialized applications. · Examine ionization balance tables plus data on individual emission lines and continua. · (optional) Use new ISIS functionality with familiar XSPEC models. All XSPEC additive, multiplicative and convolution models are available, including table models and local models. · Analyze data formatted as ASCII files or FITS Type I or Type II PHA files. · Fit scatter data. · Read arbitrary FITS files and columnar ASCII tables. · Rebin your data interactively, with direct control over how uncertainties are propagated. · Factor an RSP matrix into an ARF and a normalized RMF. · Fit spectral models to your data either directly, or by folding models through the instrument response. · Generate fake data for Monte-Carlo analysis of model uncertainties and for proposal planning. · Analyze piled-up CCD spectra using the model developed by John Davis (MIT). · Do multi-order spectral analysis (e.g. using the Chandra/LETGS) by assigning multiple instrument responses to a single dataset. · Fit multiple data sets simultaneously, including an optional instrumental background component. · Easily combine multiple datasets, fitting a model to the summed data. · Define fit-parameters as arbitrary functions of other fit-parameters (including inequality constraints). · Impose arbitrary fit-constraints by introducing user-defined penalty functions. · Compute single-parameter confidence limits · Generate confidence contour maps; save and re-read as FITS images; plot and overplot contours. · Fit user-defined models coded in S-Lang, C or Fortran · Apply user-defined fit-statistics coded in S-Lang, C or Fortran · Apply user-defined fit-methods coded in C or Fortran · Apply user-defined RMFs defined in software (rather than as a FITS file) · Dynamically load C, C++, and FORTRAN code from external modules · With the PVM module, distribute computationally expensive tasks across a network of workstations.


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